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VILLARROEL POBLETE, JUAN CHRISTIAN ; SANTO, CLAUDIA ; ARIAS, JUAN ; BARRETO, LUIS H. ; DAJES, ARISTIDES ; PINZON, ORLANDO ; DE LA CRUZ, LEONARDO ; REYEROS, ABELARDO ; ANGULO, WILSON ; RAMIREZ, RUBEN RICARDO ; HAUCKE, GUENTHER ; OLIVA C., HERNAN ; SOTO PINTO, LUIS RUBEN ; RODRIGUEZ, ERNESTO | Montevideo [URUGUAY] : Laboratorio Tecnológico del Uruguay (LATU) | 2009At regional level, Chile is part of the Interamerican Metrology System (SIM) that is the result of the achieved agreements among the 34 member countries of the Organization of American States (OEA) to promote metrology. The SIM consists of five [...]
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